Founded in 2019 and based in Foshan Nanhai, Plutosemi Co., Ltd. specializes in high-performance semiconductor materials. As an industry leader, we offer advanced production capabilities and high-quality products such as silicon wafers and SOI, featuring high precision for diverse applications. Our one-stop services and customized solutions meet specific customer needs. Widely used in China, Europe, and the USA, we maintain strong partnerships with renowned international companies, upholding the philosophy of "Customer First, Quality Foremost".
The company maintains industry-leading standards with certifications in high-performance semiconductor materials R&D, production, and sales, supporting its position as a leader in the semiconductor materials sector.
Total Thickness Variation is one of the most critical geometric parameters used to evaluate wafer quality. In simple terms, wafer TTV refers to the difference between the maximum and minimum thickness across a single wafer surface. Although the variation may only be measured in microns, it has a direct impact on process stability...
Semiconductor devices rely on wafers that meet strict geometric, structural, and surface requirements. Even minor deviations in thickness, contamination, or crystal integrity can lead to yield loss or unstable device performance. That is why wafer quality testing is treated as a core part of the production chain rather than a final checkpoint.
Wafer geometry has a direct influence on process accuracy, equipment compatibility, and final chip yield. In semiconductor manufacturing, a wafer may look smooth to the eye and still fail critical process windows if its surface is not controlled tightly enough.
